Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
Home › Apparatus and method for testing and debugging an integrated circuit

Apparatus and method for testing and debugging an integrated circuit

US Patent 8161336 · Granted Apr 17, 2012

Estimated economic value: $2,825,000 ⓘ

Assignee

Inventors

View full patent text on Google Patents →

More Patents by These Inventors

System and method for reliable and scalable health monitoring2020
Method and system for pairing a sensor device to a user2019
Gas collection apparatus and method to analyze a human breath sample2019
Gas-sensing apparatus with a self-powered microheater2018
Method and system for pairing a sensor device to a user2018
System and method for reliable and scalable health monitoring2017
System and method for transferring serialized test result data from a system on 2017
System and method for transferring serialized test result data from a system on 2017
System and method for transferring serialized test result data from a system on 2017
Body composition scale2017
Digital health monitoring device2017
High latency interface between hardware components2016