Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
Home › Inspection apparatus and an inspection method for inspecting a circuit pattern

Inspection apparatus and an inspection method for inspecting a circuit pattern

US Patent 8121395 · Granted Feb 21, 2012

Estimated economic value: $131,000 ⓘ

Assignee

Inventors

View full patent text on Google Patents →

More Patents by These Inventors

Defect inspection apparatus and defect inspection method2025
Defect inspection device2025
Surface inspection device and shape measurement software2025
Defect inspection apparatus and defect inspection method2025
Defect inspection device, defect inspection method, and adjustment substrate2025
Defect inspection apparatus and defect inspection method2025
Defect inspection device and defect inspection method2025
Defect inspection apparatus2025
Connector and flat cable2025
Defect inspection apparatus and defect inspection method2025
Defect inspection device2024
Defect inspection apparatus and defect inspection program2024