Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
Home › Systems and methods for parametric mapping for correction of noise-based systematic bias of DTI metrics, using a DTI mapping phantom

Systems and methods for parametric mapping for correction of noise-based systematic bias of DTI metrics, using a DTI mapping phantom

US Patent 8098068 · Granted Jan 17, 2012

Assignee

Inventors

View full patent text on Google Patents →

More Patents by These Inventors

Instrument panel for automobile2022
Systems and methods for measuring and modeling in vivo manganese ion transport i2014
Systems and methods for measuring and modeling in vivo manganese ion transport i2014
System and method for indirectly measuring calcium ion efflux2014
System and method for synthesizing crossing ADC distributions via reassembly of 2012
Test object for use with diffusion MRI and system and method of synthesizing com2012
Test object for use with diffusion MRI and system and method of synthesizing com2012
Systems and methods for rescaling image intensities with diffusion MRI to synthe2011
Systems and methods for rescaling image intensities with diffusion MRI to synthe2011
Saw and etch singulation method for a chip package2005
Semiconductor package with singulation crease2003