Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
Home › Method for acquiring basic characteristic of simultaneous switching noise in method for estimating simultaneous switching noise on semiconductor device

Method for acquiring basic characteristic of simultaneous switching noise in method for estimating simultaneous switching noise on semiconductor device

US Patent 8079012 · Granted Dec 13, 2011

Assignee

Inventors

View full patent text on Google Patents →

More Patents by These Inventors

Semiconductor device and electronic device2017
Method and system for voltage fluctuation amount calculation2013
Jitter amount estimating method, method for calculating correlation between amou2012
Method and device for estimating simultaneous switching noise in semiconductor d2012
Method and device for estimating simultaneous switching noise in semiconductor d2011
Synchronous DRAM utilizable as shared memory2005
Circuit that prevents illegal transformation of data in a non-volatile memory an2001