Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
Home › Atomic force microscope with combined FTIR-Raman spectroscopy having a micro thermal analyzer

Atomic force microscope with combined FTIR-Raman spectroscopy having a micro thermal analyzer

US Patent 8037945 · Granted Oct 18, 2011

Assignee

Inventors

View full patent text on Google Patents →

More Patents by These Inventors

Methods of separating materials by use of a centrifugal contactor2024
Methods of separating materials by use of a centrifugal contactor2024
Centrifugal contactor including central dynamic examination device2023
Centrifugal contactor including central dynamic examination device2023
Heavy metal separations using strongly paramagnetic column packings in a nonhomo2020
Methods and materials for determination of distribution coefficients for separat2020
Device for measuring material deterioration in equipment2019