Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
Home › Method and apparatus for testing devices using serially controlled intelligent switches

Method and apparatus for testing devices using serially controlled intelligent switches

US Patent 7977959 · Granted Jul 12, 2011

Estimated economic value: $1,702,000 ⓘ

Assignee

Inventors

View full patent text on Google Patents →

More Patents by These Inventors

Method and apparatus for testing devices using serially controlled intelligent s2014
Method and apparatus for testing devices using serially controlled intelligent s2014
Test systems and methods for testing electronic devices2013
Wafer level contactor2013
Method and apparatus for testing devices using serially controlled resources2011
Single platform electronic tester2007
Probe card with coplanar daughter card2006
Single platform electronic tester2006
Single platform electronic tester2004
Single platform electronic tester2002
Low mercury arc discharge lamp containing neodymium1995
Low mercury arc discharge lamp containing praseodymium1994