Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
Home › Method for testing the error ratio BER of a device according to confidence level, test time and selectivity

Method for testing the error ratio BER of a device according to confidence level, test time and selectivity

US Patent 7895480 · Granted Feb 22, 2011

Assignee

Inventors

View full patent text on Google Patents →

More Patents by These Inventors

Method to perform a statistical test in which the experiment is multinomial2010
Method for testing the error ratio of a device using a preliminary probability2009
Method for testing the error ratio of a device2008
Method to evaluate whether a time delay is better than a time limit2008
Time delay evaluation2006
Method of generating an RF signal modulated by a message signal and distorted by1990
Sine wave oscillator and method of operating same1990