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Home › Method of scanning a sample plate surface mask in an area adjacent to a conductive area using matrix-assisted laser desorption and ionization mass spectrometry

Method of scanning a sample plate surface mask in an area adjacent to a conductive area using matrix-assisted laser desorption and ionization mass spectrometry

US Patent 7858387 · Granted Dec 28, 2010

Estimated economic value: $7,484,000 ⓘ

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