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Home › Bist DDR memory interface circuit and method for self-testing the same using phase relationship between a data signal and a data strobe signal

Bist DDR memory interface circuit and method for self-testing the same using phase relationship between a data signal and a data strobe signal

US Patent 7834615 · Granted Nov 16, 2010

Estimated economic value: $12,504,000 ⓘ

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