Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
Home › Test jig for testing a packaged high frequency semiconductor device

Test jig for testing a packaged high frequency semiconductor device

US Patent 7825677 · Granted Nov 2, 2010

Estimated economic value: $105,000 ⓘ

Assignee

Inventors

View full patent text on Google Patents →

More Patents by These Inventors

Cell culture apparatus2025
Cell culture apparatus2025
Motor drive device, electric blower, electric vacuum cleaner, and hand dryer2024
Electromagnetic contactor2023
Image processing apparatus, image processing method, computer program, and movab2016
Distance measuring system2015
Unit pixel for accurately removing reset noise, solid-state image sensing device2015
Photoelectric conversion element, light receiving device, light receiving system2015
Solid-state image sensing device with a change-over switch2015
Photoelectric conversion element, light receiving device, light receiving system2015
Photoelectric conversion element, light receiving device, light receiving system2015
Solid-state imaging device2014