Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
Home › Image analysis for pick and place machines with in situ component placement inspection

Image analysis for pick and place machines with in situ component placement inspection

US Patent 7813559 · Granted Oct 12, 2010

Estimated economic value: $691,000 ⓘ

Assignee

Inventors

View full patent text on Google Patents →

More Patents by These Inventors

Three-dimensional sensor with counterposed channels2023
Wireless substrate-like teaching sensor for semiconductor processing2022
Structured light projection for specular surfaces2022
Structured light projection for specular surfaces2021
Three-dimensional sensor with counterposed channels2021
Three-dimensional sensor with counterposed channels2021
Three-dimensional sensor with counterposed channels2021
Point cloud merging from multiple cameras and sources in three-dimensional profi2019
Autonomous mobile robot2018
Updating calibration of a three-dimensional measurement system2017
Autonomous mobile robot2016
Dark field illuminator with large working area2014