Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
Home › Ion beam inspection apparatus, ion beam inspecting method, semiconductor manufacturing apparatus, and ion source apparatus

Ion beam inspection apparatus, ion beam inspecting method, semiconductor manufacturing apparatus, and ion source apparatus

US Patent 7807985 · Granted Oct 5, 2010

Estimated economic value: $21,161,000 ⓘ

Assignee

Inventors

View full patent text on Google Patents →

More Patents by These Inventors

Headlight for an automobile2016
Light-emitting diode lamp2015
Liquid-sealed vibration control equipment and elastic partition film for use the2009
Threshold voltage (Vth), power supply (VDD), and temperature compensation bias c2006
Fluid-sealed anti-vibration device2005
Modulation circuit for wireless installation2004
Liquid-filled type vibration isolating device and manufacturing method thereof2003
Heat transfer pipe for refrigerant mixture2002
Liquid-sealed vibration insulator and method for producing same2002
Plesiochronous digital hierarchy low speed signal switching digital phase-locked2001
Heat exchanger and air conditioner using same2000
Refrigeration cycle2000