Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
Home › Primary collimator and systems for x-ray diffraction imaging, and method for fabricating a primary collimator

Primary collimator and systems for x-ray diffraction imaging, and method for fabricating a primary collimator

US Patent 7787591 · Granted Aug 31, 2010

Assignee

Inventors

View full patent text on Google Patents →

More Patents by These Inventors

System for detecting counterfeit goods and method of operating the same2019
X-ray diffraction imaging system with signal aggregation across voxels containin2016
X-ray diffraction imaging system with integrated supermirror2015
Angle-dependent X-ray diffraction imaging system and method of operating the sam2015
Angle-dependent X-ray diffraction imaging system and method of operating the sam2015
Multi-stage security screening system and smart communication system2015
Non-tracking solar collector device2014
System and method for correcting X-ray diffraction profiles2014
Method and system for deriving molecular interference functions from XRD profile2013
Secondary collimator and method of making the same2012
Secondary collimator and method of making the same2012
Method and system for performing materials analysis with reflected inelastic sca2012