Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
Home › Apparatus for testing a phrase-locked loop in a boundary scan enabled device

Apparatus for testing a phrase-locked loop in a boundary scan enabled device

US Patent 7774665 · Granted Aug 10, 2010

Estimated economic value: $965,000 ⓘ

Assignee

Inventors

View full patent text on Google Patents →

More Patents by These Inventors

Method and apparatus for RF built-in test system for a beamforming module in a r2024
Multi-level output driver with adjustable pre-distortion capability2022
Multi-level output driver with adjustable pre-distortion capability2020
Field-programmable gate array low voltage differential signaling driver utilizin2009
Field-programmable gate array low voltage differential signaling driver utilizin2009
Apparatus for interfacing and testing a phase locked loop in a field programmabl2008
Apparatus for interfacing and testing a phase locked loop in a field programmabl2008
Field-programmable gate array low voltage differential signaling driver utilizin2008
Field-programmable gate array low voltage differential signaling driver utilizin2008
Field-programmable gate array low voltage differential signaling driver utilizin2006
Field-programmable gate array low voltage differential signaling driver utilizin2006
Field-programmable gate array low voltage differential signaling driver utilizin2005