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Home › Implementing precise resistance measurement for 2D array efuse bit cell using differential sense amplifier, balanced bitlines, and programmable reference resistor

Implementing precise resistance measurement for 2D array efuse bit cell using differential sense amplifier, balanced bitlines, and programmable reference resistor

US Patent 7764531 · Granted Jul 27, 2010

Estimated economic value: $6,569,000 ⓘ

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