Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
Home › Pattern invariant focusing of a charged particle beam

Pattern invariant focusing of a charged particle beam

US Patent 7759642 · Granted Jul 20, 2010

Estimated economic value: $9,031,000 ⓘ

Assignee

Inventors

View full patent text on Google Patents →

More Patents by These Inventors

System and method for scanning an object with an electron beam using overlapping2020
Charged particle beam device, charged particle beam influencing device, and meth2019
Aluminum profile coated with organic resin and non-leafing pigments1990