Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
Home › Intelligent inspection based on test chip probe failure maps

Intelligent inspection based on test chip probe failure maps

US Patent 7715997 · Granted May 11, 2010

Estimated economic value: $6,521,000 ⓘ

Assignee

Inventors

View full patent text on Google Patents →

More Patents by These Inventors

Packing objects by predicted lifespans in cloud storage2024
Methods for reducing risk of onset of acute graft versus host disease after hema2024
Access pattern driven data placement in cloud storage2023
Packing objects by predicted lifespans in cloud storage2022
Methods for inhibiting rust infections of plants1993