Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
Home › Semiconductor integrated circuit and method of testing semiconductor integrated circuit

Semiconductor integrated circuit and method of testing semiconductor integrated circuit

US Patent 7712001 · Granted May 4, 2010

Assignee

Inventors

View full patent text on Google Patents →

More Patents by These Inventors

Information processing device and processing method2023
Semiconductor integrated circuit2012
Semiconductor integrated circuit and method of saving and restoring internal sta2012
Semiconductor integrated circuit2011
Semiconductor integrated circuit2010
Digital circuit2008
Layout structure of multiplexer cells2005
Wiring designing method for semiconductor integrated circuit2003
Huffman decoder using two priority encoder to reduce circuit scale2001