Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
Home › Methods and devices for independent evaluation of cell integrity, changes and origin in chip design for production workflow

Methods and devices for independent evaluation of cell integrity, changes and origin in chip design for production workflow

US Patent 7685545 · Granted Mar 23, 2010

Assignee

No assignee recorded.

Inventors

View full patent text on Google Patents →

More Patents by These Inventors

Cross-talk suppression in Geiger-mode avalanche photodiodes2020
Cross-talk suppression in Geiger-mode avalanche photodiodes2019
Identifying hierarchical chip design intellectual property through digests2013
Method for reading polygon data into an integrated circuit router2013
Methods and devices for independent evaluation of cell integrity, changes and or2012
Methods and devices for independent evaluation of cell integrity, changes and or2012
Approach for routing an integrated circuit2009
System and method of analyzing communications between a calling party and a call2006
Approach for routing an integrated circuit2006
High energy, low energy density, radiation-resistant optics used with micro-elec2005
Planarization compositions and methods for removing interlayer dielectric films2001
Methods and apparatus for design rule checking2001