Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
Home › Test system employing test controller compressing data, data compressing circuit and test method

Test system employing test controller compressing data, data compressing circuit and test method

US Patent 7681097 · Granted Mar 16, 2010

Assignee

Inventors

View full patent text on Google Patents →

More Patents by These Inventors

In-wheel motor cooling apparatus and method2025
Memory modules and memory systems including a power management integrated circui2021
Memory modules storing a trimming control code associated with a minimum level o2019
Semiconductor memory device having physically shared data path and test device f2012
Data transceiver system and associated methods2012
Method and apparatus for generating high-frequency command and address signals f2010
Circuit of detecting power-up and power-down2010
Test pattern generating circuit and semiconductor memory device having the same2010
Output driver that operates both in a differential mode and in a single mode2009