Substrate damage detection mechanism using RFID tag

Assignee

• Chung Hua University

Inventors

• Chi-Kuang Hwang (11 patents)
• In-Hang Chung (4 patents)
• Chih-Hu Wang (3 patents)
• Ching-Cheng Tien (10 patents)
• Bore-Kuen Lee (4 patents)
• Tung-Chou Chen (5 patents)
• Chia-Wen Wu (11 patents)
• Chien-Jung Chiu (7 patents)
• Ming-Ching Yen (11 patents)
• Jwu-E Chen (5 patents)

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