Specimen inspection equipment and how to make electron beam absorbed current images

Assignee

• Hitachi High-Technologies

Inventors

• Tomoharu Obuki (4 patents)
• Hiroshi Toyama (54 patents)
• Yasuhiro Mitsui (62 patents)
• Munetoshi Fukui (3 patents)
• Yasuhiko Nara (43 patents)
• Tohru Ando (18 patents)
• Katsuo Ooki (3 patents)
• Tsutomu Saito (106 patents)
• Unknown

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