Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
Home › Probe member for wafer inspection, probe card for wafer inspection and wafer inspection equipment

Probe member for wafer inspection, probe card for wafer inspection and wafer inspection equipment

US Patent 7656176 · Granted Feb 2, 2010

Assignee

Inventors

View full patent text on Google Patents →

More Patents by These Inventors

Target detection method and detection device2025
Anisotropic conductive connector, probe member and wafer inspection system2013
Method for manufacturing a stator core for an axial air-gap electronic motor2011
Sheet-like probe, method of producing the probe, and application of the probe2010
Sheet-like probe, method of producing the probe, and application of the probe2010
Sheet-like probe, method of producing the probe, and application of the probe2010
Sheet-like probe, method of producing the probe, and application of the probe2010
Sheet-like probe, method of producing the probe, and application of the probe2010
Sheet-like probe, method of producing the probe, and application of the probe2010
Probe apparatus, wafer inspecting apparatus provided with the probe apparatus an2008
Anisotropic conductive connector and wafer inspection device2008
Anisotropic conductive connector, conductive paste composition, probe member, wa2007