Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
Home › Test method for semiconductor memory device and semiconductor memory device therefor

Test method for semiconductor memory device and semiconductor memory device therefor

US Patent 7633818 · Granted Dec 15, 2009

Assignee

Inventors

View full patent text on Google Patents →

More Patents by These Inventors

Semiconductor device including memory cell having capacitor2013
Semiconductor device including memory cell having capacitor2013
Oscillation device, method of oscillation, and memory device2011
Oscillating device, method of adjusting the same and memory2011
Semiconductor device and system2010
Semiconductor device with current mirror circuit having two transistors of ident2010
Semiconductor memory device including a terminal for receiving address signal an2010
Semiconductor memory, system, and operating method of semiconductor memory2010
Semiconductor memory device containing antifuse write voltage generation circuit2009
Low current consumption semiconductor memory device2009
Semiconductor memory device with partial refresh function2009
Semiconductor device and fabrication method thereof2009