Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
Home › Yield analysis and improvement using electrical sensitivity extraction

Yield analysis and improvement using electrical sensitivity extraction

US Patent 7574682 · Granted Aug 11, 2009

Assignee

Inventors

View full patent text on Google Patents →

More Patents by These Inventors

Placing filler cells in device design based on designation of sensitive feature 2012
Transistor with gain variation compensation2011
Method and system for improving the manufacturability of integrated circuits2010
Ion pumping of a flat microtip screen2000
Flat display screen anode with protection ring for collecting secondary electron1999