Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
Home › Parametric measurement of high-speed I/O systems

Parametric measurement of high-speed I/O systems

US Patent 7571363 · Granted Aug 4, 2009

Estimated economic value: $19,533,000 ⓘ

Assignee

Inventors

View full patent text on Google Patents →

More Patents by These Inventors

Automated test equipment and method using device specific data2025
Automated test equipment for testing one or more devices under test, method for 2024
Automated test equipment for testing one or more devices under test, method for 2022
Automated test equipment using an on-chip-system test controller2022
System, methods and apparatus using virtual appliances in a semiconductor test e2018
System, methods and apparatus using virtual appliances in a semiconductor test e2016
System and method for adjusting a serial communications link2011
Diagnostic information capture from logic devices with built-in self test2010
ATE architecture and method for DFT oriented testing2010
Re-configurable architecture for automated test equipment2009
Re-configurable architecture for automated test equipment2009
Systems and methods for processing automatically generated test patterns2008