Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
Home › High-speed, scanning phase-shifting profilometry using 2D CMOS sensor

High-speed, scanning phase-shifting profilometry using 2D CMOS sensor

US Patent 7525669 · Granted Apr 28, 2009

Assignee

No assignee recorded.

Inventors

View full patent text on Google Patents →

More Patents by These Inventors

Scanning 3D measurement technique using structured lighting and high-speed CMOS 2008
Machine vision system for measuring heights of items2007
Automated inspection of packaging materials for package integrity2006