Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
Home › Camera based two-point vision alignment for semiconductor device testing handlers

Camera based two-point vision alignment for semiconductor device testing handlers

US Patent 7506451 · Granted Mar 24, 2009

Assignee

Inventors

View full patent text on Google Patents →

More Patents by These Inventors

Light line imager-based IC tray pocket detection system2019
IC device-in-pocket detection with angular mounted lasers and a camera2019
Micro-vision alignment system with guiding rings for IC testing2018
Method and apparatus for IC 3D lead inspection having color shadowing2017
Group vision alignment for double sided IC device testing2017
Imaging system with defocused and aperture-cropped light sources for detecting s2015
Up-look camera based vision apparatus to auto align pick-and-place positions for2014
Vision alignment with multiple cameras and common coordinate at contactor for IC2012
Vision alignment with multiple cameras and common coordinate at contactor for IC2012
IC device-in-pocket detection with angular mounted lasers and a camera2011
Method of manufacturing a heat sink pedestal device with interface medium chambe2011
Camera based vision alignment with device group guiding for semiconductor device2010