Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
Home › Testable cascode circuit and method for testing the same using a group of switching elements

Testable cascode circuit and method for testing the same using a group of switching elements

US Patent 7504846 · Granted Mar 17, 2009

Assignee

Inventors

View full patent text on Google Patents →

More Patents by These Inventors

One-time programmable memory devices2008
Driver circuit for a display device2005
ESD protection for a CMOS output stage2004
Arrangement for improving the ESD protection in a CMOS buffer2003
Display device2002
Method of manufacturing a liquid crystal display module capable of performing a 2001
Interconnection structure with raised perimeter portions1999