Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
Home › Method and system for mass analysis of samples

Method and system for mass analysis of samples

US Patent 7504621 · Granted Mar 17, 2009

Estimated economic value: $7,491,000 ⓘ

Assignee

Inventors

View full patent text on Google Patents →

More Patents by These Inventors

Dynamically concentrating ion packets in the extraction region of a TOF mass ana2025
Two-and-a-half channel detection system for time-of-flight (TOF) mass spectromet2020
Ion optical elements2017
Windowing combined with ion-ion reactions for chemical noise elimination2016
Ion fragmentation in mass spectrometry2010
Confining ions with fast-oscillating electric fields2009
Mass spectrometer multiple device interface for parallel configuration of multip2008
Method and system for mass analysis of samples2006
MS/MS scan methods for a quadrupole/time of flight tandem mass spectrometer2003
MS/MS scan methods for a quadrupole/time of flight tandem mass spectrometer2001
Method for improved signal-to-noise for multiply charged ions2000