Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
Home › Device for detecting defects in electrically conductive materials in a nondestructive manner

Device for detecting defects in electrically conductive materials in a nondestructive manner

US Patent 7495433 · Granted Feb 24, 2009

Estimated economic value: $1,011,000 ⓘ

Assignee

Inventors

View full patent text on Google Patents →

More Patents by These Inventors

Apparatus for detection of the gradient of a magnetic field, and a method for pr2009
Motion detector according to the Ferraris principle2005
Circuit arrangement for evaluating an acceleration sensor using the Ferraris pri2005
Device for measuring the motion of a conducting body through magnetic induction2005
Method and device for the in situ detection of the degree of conversion of a non2004
Device for eddy current measurement of a motion of a conducting body in a magnet2003
Scanning head for eddy-current testing, method for processing a scanning head fo2002
SQUID-magnetometer for measuring weak magnetic fields with gradiometer loops and1990
Thin film SQUID magnetometer for a device for measuring weak magnetic fields1989
Method for making a superconducting gradiometer having a three-dimensional struc1987