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Home › Apparatus and method for test, characterization, and calibration of microprocessor-based and digital signal processor-based integrated circuit digital delay lines

Apparatus and method for test, characterization, and calibration of microprocessor-based and digital signal processor-based integrated circuit digital delay lines

US Patent 7495429 · Granted Feb 24, 2009

Estimated economic value: $11,214,000 ⓘ

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