Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
Home › Determining the value of internal signals in a malfunctioning integrated circuit

Determining the value of internal signals in a malfunctioning integrated circuit

US Patent 7493434 · Granted Feb 17, 2009

Assignee

Inventors

View full patent text on Google Patents →

More Patents by These Inventors

Programmable interconnect for reconfigurable system-on-chip2010
Methods for delay-fault testing in field-programmable gate arrays2008
Serial implementation of assertion checking logic circuit2007
Method to locate logic errors and defects in digital circuits2007
Fixing functional errors in integrated circuits2006
Assertion checking using two or more cores2006
Reconfigurable fabric for SoCs using functional I/O leads2006
Sequential test pattern generation using clock-control design for testability st2006
Fault tolerant operation of field programmable gate arrays2005
Identifying faulty programmable interconnect resources of field programmable gat2005
Fault tolerant operation of reconfigurable devices utilizing an adjustable syste2005
Sequential test pattern generation using combinational techniques2004