Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
Home › Non-linear terahertz spectroscopy for defect density identification in high k dielectric films

Non-linear terahertz spectroscopy for defect density identification in high k dielectric films

US Patent 7459687 · Granted Dec 2, 2008

Assignee

Inventors

View full patent text on Google Patents →

More Patents by These Inventors

Systems and methods of detecting pipe defects2023
Energy packet switches2021
Polydiacetylene and polydiacetylene/ZnO nanocomposite sensors2018
Fabrication of flexible conductive items and batteries using modified inks2018
Packeted energy delivery system and methods2017
TCDA/zinc oxide nanocomposites and film sensors2016
Methods and apparatus for the non-destructive measurement of diffusion in non-un2016
TCDA/zinc oxide nanocomposites and film sensors2016
Graphene deposition and graphenated substrates2015
Metamaterials with terahertz response and methods of making same2015
System and method for terahertz 2D interferometric and synthetic aperture imagin2015
Graphene deposition and graphenated substrates2013