Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
Home › Integrated memory having a circuit for testing the operation of the integrated memory, and method for operating the integrated memory

Integrated memory having a circuit for testing the operation of the integrated memory, and method for operating the integrated memory

US Patent 7454662 · Granted Nov 18, 2008

Estimated economic value: $176,000 ⓘ

Assignee

Inventors

View full patent text on Google Patents →

More Patents by These Inventors

Method for testing semiconductor chips by means of bit masks2008
Method for testing semiconductor chips using register sets2008
Semiconductor memory component and method for testing semiconductor memory compo2008
Semiconductor memory component and method for testing semiconductor memory compo2008
Method and apparatus for internally trimming output drivers and terminations in 2006
Test arrangement for testing semiconductor circuit chips2006
Circuit and method for testing a data memory2005
Apparatus and method for the parallel and independent testing of voltage-supplie2005
Method for testing semiconductor chips2005
Configuration for testing semiconductor devices2004
Test system for conducting a function test of a semiconductor element on a wafer2004
Device and method for calibrating the pulse duration of a signal source2004