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Home › Ionising particle analyser enabling for example the separation of the fluorescent yield (FY) and the total electron yield (TEY) in EXAPS (extended X-ray absorption fine structure) measurements

Ionising particle analyser enabling for example the separation of the fluorescent yield (FY) and the total electron yield (TEY) in EXAPS (extended X-ray absorption fine structure) measurements

US Patent 7432501 · Granted Oct 7, 2008

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