Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
Home › High sensitivity slitless ion source mass spectrometer for trace gas leak detection

High sensitivity slitless ion source mass spectrometer for trace gas leak detection

US Patent 7427751 · Granted Sep 23, 2008

Estimated economic value: $58,005,000 ⓘ

Assignee

Inventors

View full patent text on Google Patents →

More Patents by These Inventors

Systems and methods for route guidance through a waterway2025
Apparatuses and methods for producing covetic materials using microwave reactors2025
Systems and methods for pyrolysis reactions2024
Apparatuses and methods for producing covetic materials using microwave reactors2023
System for determining muzzle velocity of a firearm2022
Systems and methods for firearm aim-stabilization2022
Duoplasmatron ion source with a partially ferromagnetic anode2022
Cesium primary ion source for secondary ion mass spectrometer2020
Pressure barrier comprising a transparent microwave window providing a pressure 2020
Secure object having protected region, integrity tree, and unprotected region2018
Cesium primary ion source for secondary ion mass spectrometer2018
Traveling-well ion guides and related systems and methods2017