Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
Home › System for measuring and cutting

System for measuring and cutting

US Patent 7401416 · Granted Jul 22, 2008

Assignee

No assignee recorded.

Inventors

View full patent text on Google Patents →

More Patents by These Inventors

Impedance qualization module2007
Tapered delay line2004
Conformal-coated pick and place compatible devices2003
Hermetic multi-layered circuit assemblies and method of manufacture2002
Modular thin film distributed filter2001
Modular thin film distributed filter2000
Differential delay line1998
Shielded delay line and method of manufacture1998
Thermally matched electronic components1996
Folding delay line1991
Thin film delay lines having a serpentine delay path1990