Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
Home › Large-field scanning of charged particles

Large-field scanning of charged particles

US Patent 7394069 · Granted Jul 1, 2008

Estimated economic value: $12,662,000 ⓘ

Assignee

Inventors

View full patent text on Google Patents →

More Patents by These Inventors

Field replaceable, disposable, and thermally optimized X-ray target with integra2023
Field replaceable, disposable, and thermally optimized X-ray target with integra2022
Bremsstrahlung target for radiation therapy system2021
Bremsstrahlung target for radiation therapy system2020
Method and apparatus for inspecting a substrate2016
Method and apparatus for inspecting a substrate2015
Inline inspection of photovoltaics for electrical defects2013
Inline inspection of photovoltaics for electrical defects2011
Inline inspection of photovoltaics for electrical defects2010
Method for charging substrate to a potential2009
Electronically-variable immersion electrostatic lens2008
Electron imaging beam with reduced space charge defocusing2008