Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
Home › Method and apparatus for testing a functional circuit at speed

Method and apparatus for testing a functional circuit at speed

US Patent 7383481 · Granted Jun 3, 2008

Estimated economic value: $5,441,000 ⓘ

Assignee

Inventors

View full patent text on Google Patents →

More Patents by These Inventors

Command queuing2025
Command queuing2024
Command queuing2022
Command queuing2021
Inline analyzer for a milking machine2019
Command queuing2018
Inline analyzer for a milking machine system2018
Command queuing2016
Pulsed serial link transmitting data and timing information on a single line2015
Tap time division multiplexing with scan test2013
Flow controlled pulsed serial link2013
Calibrated pulsed serial link2012