Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
Home › Measurement deferral and aggregation for extensible test configuration

Measurement deferral and aggregation for extensible test configuration

US Patent 7372946 · Granted May 13, 2008

Estimated economic value: $3,334,000 ⓘ

Assignee

Inventors

View full patent text on Google Patents →

More Patents by These Inventors

System and method for constructing transactions from electronic content2011
Multisided synchronization of execution in a wireless test environment2009
System for and method of multi-location test execution2008
System and method for controlling data processing in a computer transaction2008
Intelligent power cycling of a wireless modem2007
Multisided sharing of dynamic data in a wireless test environment2007
Achieving consistency and synchronization among multiple data stores that cooper2001