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Home › Systems and methods for phase measurements

Systems and methods for phase measurements

US Patent 7365858 · Granted Apr 29, 2008

Assignee

MIT

Inventors

Christopher Fang-Yen (9 patents)
Gabriel Popescu (23 patents)
Changhuei Yang (98 patents)
Adam Wax (23 patents)
Ramachandra Dasari (13 patents)
Michael S. Feld (56 patents)

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