Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
Home › Method and apparatus for characterizing microelectromechanical devices on wafers

Method and apparatus for characterizing microelectromechanical devices on wafers

US Patent 7345806 · Granted Mar 18, 2008

Estimated economic value: $5,664,000 ⓘ

Assignee

Inventors

View full patent text on Google Patents →

More Patents by These Inventors

System and method for droplet detection2025
System and method for droplet detection2022
Illumination content translation2021
Lighting having spectral content synchronized with video2019
Editing of illumination and non-illumination content2019
Setting lighting based on the colors of samples2018
Lighting system with sensor feedback2018
Perforated mother sheet for partial edge chemical strengthening and method there2018
Illumination content production and use2017
Method of light spectrum replication2017
Method for fabricating thin sheets of glass2017
Synthesizing lighting to control apparent colors2017