Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
Home › System and methods for characterization of chemical arrays for quality control

System and methods for characterization of chemical arrays for quality control

US Patent 7333907 · Granted Feb 19, 2008

Estimated economic value: $10,956,000 ⓘ

Assignee

Inventors

View full patent text on Google Patents →

More Patents by These Inventors

Hexagonal phase epitaxial cadmium sulfide on copper indium gallium selenide for 2019
Photovoltaic cell with high efficiency CIGS absorber layer with low minority car2019
Photovoltaic cell with high efficiency cigs absorber layer with low minority car2018
Method for determining ploidy of a cell2015
Photovoltaic cell with copper poor CIGS absorber layer and method of making ther2015
Method of sensing local sputtering target selenization2014
Protective layer for large-scale production of thin-film solar cells2013
Instrument control system and methods2012
Method of characterizing quality of hybridized CGH arrays2012
Method and apparatus for controllable sodium delivery for thin film photovoltaic2012
Method and apparatus for controllable sodium delivery for thin film photovoltaic2012
Protective layer for large-scale production of thin-film solar cells2012