Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
Home › Testing apparatus and method for a spectral imaging system

Testing apparatus and method for a spectral imaging system

US Patent 7327896 · Granted Feb 5, 2008

Estimated economic value: $24,470,000 ⓘ

Assignee

Inventors

View full patent text on Google Patents →

More Patents by These Inventors

Nano avalanche photodiode architecture for photon detection2020
Nano avalanche photodiode architecture for photon detection2020
Nano avalanche photodiode architecture for photon detection2020
Nano avalanche photodiode architecture for photon detection2019
Nano avalanche photodiode architecture for photon detection2019
Nano avalanche photodiode architecture for photon detection2019
Nano avalanche photodiode architecture for photon detection2017
Nano avalanche photodiode architecture for photon detection2017
Nano avalanche photodiode architecture for photon detection2017
Carbon mixture ohmic contact for carbon nanotube transistor devices2017
Method for growing carbon nanotubes2017
Cobalt-carbon eutectic metal alloy ohmic contact for carbon nanotube field effec2016