Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
Home › Marking system for a semiconductor wafer to identify problems in mask layers

Marking system for a semiconductor wafer to identify problems in mask layers

US Patent 7303844 · Granted Dec 4, 2007

Estimated economic value: $4,182,000 ⓘ

Assignee

Inventors

View full patent text on Google Patents →

More Patents by These Inventors

Composite tape for use in tape laying machines2016
Objective assessment of application crashes from a customer environment2012
Objective assessment of application crashes from a customer environment2011
Tracking and identifying operations from un-trusted clients2011
Peer distribution point feature for system management server2010
Hardware and software identifier categorization and review2010
Certificate registration after issuance for secure communication2009
System and method of network content location for roaming clients2007
Lottery ticket scraper enabling precise removal of surface layer from ticket1989
Computer systems for curve-solid classification and solid modeling1987