Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
Home › Method and an apparatus for characterizing a high-frequency device-under-test in a large signal impedance tuning environment

Method and an apparatus for characterizing a high-frequency device-under-test in a large signal impedance tuning environment

US Patent 7282926 · Granted Oct 16, 2007

Assignee

No assignee recorded.

Inventors

View full patent text on Google Patents →

More Patents by These Inventors

Phase distortion measurement2024
Method and apparatus for characterizing homodyne transmitters and receivers2022
System and method for measuring repetitive complex and pulse modulated RF signal2022
Method and apparatus for reducing non-linear distortion2021
Method and device for detecting power of a periodic signal in a band of interest2021
Measurement of periodically modulated signals under non-coherent operating condi2021
Nonlinear distortion detection2020
Method for measuring frequency offset between an RF transmitter and a test recei2020
Method and system for characterizing, modeling and simulating non-linear compone2019
Method and system of preventing interference caused by images2018
Method and system of preventing interference caused by images2018
Receiver adapted for use in wideband phase spectrum measurements2018