Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
Home › Test head utilized in a test system to perform automated at-speed testing of multiple gigabit per second high serial pin count devices

Test head utilized in a test system to perform automated at-speed testing of multiple gigabit per second high serial pin count devices

US Patent 7278079 · Granted Oct 2, 2007

Estimated economic value: $10,072,000 ⓘ

Assignee

Inventors

View full patent text on Google Patents →

More Patents by These Inventors

Providing supplemental content for a second screen experience2025
Method to generate a localized gravitational field and gravity2025
Secure, immutable and verifiable information capture2024
Wireless adapter and handheld electronic device to wirelessly control the wirele2022
Providing supplemental content for a second screen experience2020
Ocean wave energy converter (OWEC)2010
Methods used to simultaneously perform automated at-speed testing of multiple gi2009
Method for automated at-speed testing of high serial pin count multiple gigabit 2008
System for at-speed automated testing of high serial pin count multiple gigabit 2008
Test system rider utilized for automated at-speed testing of high serial pin cou2007
Disc player improvements2006
Test system rider board utilized for automated at-speed testing of high serial p2006