Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
Home › Scanning probe microscope and specimen surface structure measuring method

Scanning probe microscope and specimen surface structure measuring method

US Patent 7241994 · Granted Jul 10, 2007

Estimated economic value: $40,000 ⓘ

Assignee

Inventors

View full patent text on Google Patents →

More Patents by These Inventors

Extracorporeal circulation management device with blood level detection in a res2023
Extracorporeal circulation apparatus2023
Extracorporeal circulation management device with heartbeat synchronizaton2023
Ground member, shielded printed circuit board, and method for manufacturing shie2020
Extracorporeal circulation management device and extracorporeal circulation devi2019
Vehicle muffler2018
Base station, radio communications system, and processing method in base station2018
Arithmetic device, arithmetic method, and wireless communication device2017
Electrical conduction element, electronic device, and method for operating elect2017
Receiving device and receiving process method2016
Double-side-coated surface stress sensor2016
Double-side-coated surface stress sensor2016