Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
Home › Method for measuring the microrelief of an object and optical characteristics of near-surface layer, modulation interference microscope for carrying out said method

Method for measuring the microrelief of an object and optical characteristics of near-surface layer, modulation interference microscope for carrying out said method

US Patent 7221458 · Granted May 22, 2007

Assignee

No assignee recorded.

Inventors

View full patent text on Google Patents →

More Patents by These Inventors

Binder for the fabrication of diamond tools2017
Copper based binder for the fabrication of diamond tools2015
System and method for conditional tracing of computer programs2012
System and method for conditional tracing of computer programs2006
Contactless magnetic spiral gear and variants thereof2004
Contactless magnetic spiral gear and variants thereof2004
Structure for accelerating heavy ions with uniformly spaced quadrupole focusing 1996